VeEX MTX640: Dual 100G/400G Portable Test Set

400G Down to 10M Ethernet Testing

Compact 2x100GE and 1x400GE Multi-service Handheld Test Set

• True All-in-One, from 10M to 400GE
• Dual test ports for 100G and below,
• and single 400GE test port,
• Up to two independent tests
• Best-in-class intelligent cooling system

VeEX MTX640 is the industry’s most compact dual 100GE portable test solution, upgradeable via software to single 400GE. With a 7-inch capacitive LCD and intuitive user interface, it is the fastest to operate, and most flexible 100/400GE solution. From boot-up to dual 100GE testing in under two minutes, the MTX640 is truly in a class of its own.

The MTX640 is an advanced handheld test solution designed with dual test engines, enabling comprehensive support for both legacy and next-generation optical transceiver form factors across a broad spectrum of applications, including Transport, Core, Metro, P2P links, DCI, transceivers, AOC, AEC, ACC, and DAC. It also offers native RJ45 (copper) interface support for rates up to 10G BASE-T, addressing the requirements of modern multi-gigabit access services.

Optimized for fast field operations, the MTX640 goes from power-up to dual 100GE testing in under two minutes, making it exceptionally suited for time-critical tasks, such as troubleshooting transceiver, network equipment verification, installation, maintenance, and commissioning tasks. With the industry-wide adoption of 400GE, the MTX640 is easily upgradeable for 400GE testing via a software option. Its intuitive graphical user interface (GUI) helps streamline the test process, empowering users to perform advanced testing immediately with application-specific test applications.

Representing a new standard in high-speed Ethernet (HSE) testing, the MTX640 is designed for user accessibility, minimizing onboarding time and simplifying complex test procedures for operators at any experience level. As a result, it is an essential tool for professionals engaged in high-speed Ethernet deployment.

• Dual 100GE concurrent testing capabilities
• Single 400GE and 200GE (software option)
• Offers dual ports for all pluggable optics form factors, required for AOC/DAC, and wrap-around tests (from 10M to 100GE)
• Native PAM4 hardware for best-in-class signal integrity (no adapters required)
• Supports testing for all common form factors, including QSFP-DD, QSFP56, SFP-DD, and SFP56 transceivers, DACs, AOCs, network equipment and 400GE links
• Wide range of supported 100/400GE interfaces, including 400GBASE-SR8, FR8, LR8, DR4, FR4, LR4, 100G LR1, FR1
• Complete industry-standard Ethernet for Layers 2, 3 and 4
• Stateful TCP Performance Test up to 400GE
• I2C/MDIO registers Read and Write
• Per-lane PAM4 host pre-emphasis settings
• Signal integrity check with FEC codeword symbol errors distribution and Skew
• Transceiver power consumption monitoring (voltage, current) and variable voltage supply
• Internal and external (cage) QSFP-DD temperature monitoring with overheating protection
• Battery operation improves mobility and efficiency
• High-efficiency intelligent cooling system

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