Electronic Components Suppliers

Feinmetall

Feinmetall

Spring contact probes for testing PC boards, provide consistent alignment with the overall range of high-precision inspection and test equipment for electronic production: from contact probes for in-circuit testing PC boards and subassemblies through to probe cards for semiconductor testing. Feinmetall also is the technology leader in the field of wafer tests.

For latest catalogues and flyers, please click HERE.

    Country: Germany
    Website: http://www.feinmetall.de

    Supplier's speciality

  • - Test probes
  • - Test heads
  • - Vi-Probe (Vertical wafertests)

Related Solutions

  • A position test at very limited space by using a probe

    A position sensor system is the ideal solution for exact measurement and documentation of pin lengths, hole depths etc. This system can be used like a contact probe even in small centers. An integrated potentiometer allows the exact determination of the position of the DUT.

  • High-Current Contacting of Blade-Connectors

    You are looking to use a flat blade connector in a high current application? But it is difficult to apply a front face with sufficient contact surface. For this reason many applications use clamps. This solution is not very durable and it has the risk of damaging the surface of the blade connector.

Related Blog messages

  • Feinmetall Tools and Accessories for Probes and Receptacles

    FEINMETALL offers a great variety of tools for installation and maintenance of contact probes and receptacles. For the mounting of standard probes, practical insertion- and screw-in tools are very useful. These tools (with integrated functions) are ideal for adjusting the correct position of the switch point. A spring force gauge additionally enables the measurement of spring forces, for example to identify inserted contact probes in existing modules or fixtures.

  • Feinmetall New Fine Pitch Probes

    The market's need for contacting semiconductor components is rapidly increasing. Components are constantly undergoing miniaturization, and so are the required contact probes for test engineering. Additionally, the signal frequencies of the test signals are getting higher and higher.

  • New Variants and Accessories for HF860 RF Probes

    The coaxially designed radio frequency probes of the family HF860 are already available for a large variety of common connectors like SMA, SMB, SMC, U.Fl., RF and others. Now the contact probe HF860 is also available for contacting FAKRA connectors (at the moment FAKRA male), that are frequently used in wire harness testing.

  • Feinmetall HF819 – optimized solution for contacting HSD-connectors

    FEINMETALL has recently redesigned the RF contact probe for contacting HSD-connectors. The new RF probe HF819 is equipped with a calyx spring for optimized guiding of the probe onto the connector. The capture area will be extended and damages can be avoided by optimizing the conical insertion of the circular contact and the position of the calyx spring. The probe HF819 is available in different versions with different tip styles of the inner pins.