Electronic Components Solutions

A position test at very limited space by using a probe

A position test at very limited space by using a probe

A position sensor system is the ideal solution for exact measurement and documentation of pin lengths, hole depths etc. This system can be used like a contact probe even in small centers. An integrated potentiometer allows the exact determination of the position of the DUT.

    Increase the product quality

  • After the assembly of a PCB, wire harness or a complete application, the ultimate question is whether the produced parts meet our quality standards. During a in circuit test or functional test, the correct operation of the assembly can be tested, however tilted components aren't detected and neither if all parts have been automatically placed or not. This can lead to longer quality analysis procedures and rework routines.

  • Contact probe solution with integrated potentiometer

  • The new Feinmetall position sensor system allows contacting a test item electrically and at the same time measuring its exact position. A position sensor system consists of a contact probe, a receptacle and a position sensor with integrated potentiometer. This system is still so lean that it can be used in fixtures or modules with standard centers like a normal contact probe. The potentiometer function allows determining the exact travel of the probe and thereby the exact position of the test item by analyzing the resulting voltage in the test system. This solution is unique at the market, a patent is pending.

  • For small centers of only 75 mil

  • Besides the already introduced position sensor system for 100 mil, now a new slim version for 75 mil has been developed. This version even allows measuring a larger range of up to 6.4 mm travel compared to 5 mm with the 100 mil solution. Also new is a more robust version for applications with 157 mil centers. This version is less sensitive of stronger forces and it can be mounted into airtight fixtures or modules (i.e. leakage rate < 0.5cm³/min at 0.7 bar). Typical applications for position sensor systems are exact measurements of hole depths, pin lengths or component heights as well as examination of injection molded pieces or bending of PCBs. The potentiometric measurement principle results in real quantitative and documentable measuring values. A reference measurement can be made to avoid wrong results caused by tolerances in the module or fixture. The position sensor systems are available with different round tip styles as well as twist proof spade tip styles.

  • Main Advantages

    Measuring electrically and the position at the same time
  • To be used in modules or fixtures with standard centers
  • To be used at very limited space
  • Centers of only 75 mil

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Supplier

  • Smartec

    Founded in 1987, Smartec B.V. was established out of a laboratory concept.
    A temperature sensor, with digital output, was developed at the Delft University of Technology (TUD), Netherlands. This sensor has proved to be more accurate and stable than any other digital temperature sensor on the market.
    Through research and development initiatives, the Smartec product range has been further enhanced with the introduction to market of the humidity sensor, infrared sensor, Universal Transducer Interface (UTI) and a complete line of pressure sensors in the range of 0.01 PSI until 300 PSI.
    Over the years Smartec has built up strategic alliances with top rated semiconductor companies in Europe and the Far East. These alliances have led to long-term partnerships, excelling in close cooperation in research and development, with the most accurate and stable sensors in nowadays market as a result.

  • Feinmetall

    Spring contact probes for testing PC boards, provide consistent alignment with the overall range of high-precision inspection and test equipment for electronic production: from contact probes for in-circuit testing PC boards and subassemblies through to probe cards for semiconductor testing. Feinmetall also is the technology leader in the field of wafer tests.

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